TSV stress aware timing analysis with applications to 3D-IC layout optimization
Jae-Seok Yang, Athikulwongse, Krit, Young-Joon Lee, Sung Kyu Lim, Pan, David Z
Published in Design Automation Conference (01.06.2010)
Published in Design Automation Conference (01.06.2010)
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Conference Proceeding
Dealing with IC manufacturability in extreme scaling
Yu, Bei, Gao, Jhih-Rong, Ding, Duo, Ban, Yongchan, Yang, Jae-seok, Yuan, Kun, Cho, Minsik, Pan, David Z.
Published in 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2012)
Published in 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (05.11.2012)
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Conference Proceeding
Layout aware line-edge roughness modeling and poly optimization for leakage minimization
Ban, Yongchan, Yang, Jae-Seok
Published in 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2011)
Published in 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2011)
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Conference Proceeding
Layout optimizations for double patterning lithography
Pan, D.Z., Jae-seok Yang, Kun Yuan, Minsik Cho, Yongchan Ban
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
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Conference Proceeding
Stress-driven 3D-IC placement with TSV keep-out zone and regularity study
Athikulwongse, K, Chakraborty, A, Jae-Seok Yang, Pan, D Z, Sung Kyu Lim
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
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Conference Proceeding
A new graph-theoretic, multi-objective layout decomposition framework for Double Patterning Lithography
Jae-Seok Yang, Lu, K., Minsik Cho, Kun Yuan, Pan, D.Z.
Published in 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2010)
Published in 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2010)
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Conference Proceeding
Design for manufacturability and reliability for TSV-based 3D ICs
Pan, D. Z., Sung Kyu Lim, Athikulwongse, K., Moongon Jung, Mitra, J., Jiwoo Pak, Pathak, M., Jae-seok Yang
Published in 17th Asia and South Pacific Design Automation Conference (01.01.2012)
Published in 17th Asia and South Pacific Design Automation Conference (01.01.2012)
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Conference Proceeding
CAD for double patterning lithography
Pan, David Z, Jae-Seok Yang, Kun Yuan, Minsik Cho
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
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Conference Proceeding
Overlay aware interconnect and timing variation modeling for Double Patterning Technology
Jae-Seok Yang, Pan, D.Z.
Published in 2008 IEEE/ACM International Conference on Computer-Aided Design (01.11.2008)
Published in 2008 IEEE/ACM International Conference on Computer-Aided Design (01.11.2008)
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Conference Proceeding
Robust Clock Tree Synthesis with timing yield optimization for 3D-ICs
Jae-Seok Yang, Jiwoo Pak, Xin Zhao, Sung Kyu Lim, Pan, D Z
Published in 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) (01.01.2011)
Published in 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) (01.01.2011)
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Conference Proceeding
Chemical-mechanical polishing aware application-specific 3D NoC design
Wooyoung Jang, Ou He, Jae-Seok Yang, Pan, D. Z.
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
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Conference Proceeding
Crosstalk Noise Variation Assessment and Analysis for the Worst Process Corner
Jae-Seok Yang, Neureuther, A.R.
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
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Conference Proceeding
Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis
Jae-Seok Yang, Jeong-Yeol Kim, Joon-Ho Choi, Moon-Hyun Yoo, Jeong-Taek Kong
Published in Fourth International Symposium on Quality Electronic Design, 2003. Proceedings (2003)
Published in Fourth International Symposium on Quality Electronic Design, 2003. Proceedings (2003)
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Conference Proceeding