Advances in magnetic-based current imaging for high resistance defects and sub-micron resolution
Knauss, L.A., Orozco, A., Woods, S.I.
Published in Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) (2004)
Published in Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) (2004)
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