Variable penetration rate cone testing for characterization of intermediate soils
DeJong, J T, Jaeger, R A, Boulanger, R W, Randolph, M F, Wahl, D A J
Published in Geotechnical and Geophysical Site Characterization : Proceedings of the 4th International Conference on Site Characterization ISC-4 (01.01.2013)
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Published in Geotechnical and Geophysical Site Characterization : Proceedings of the 4th International Conference on Site Characterization ISC-4 (01.01.2013)
Conference Proceeding
(Invited) Extending Advanced CMOS Scaling with SiGe Channel Materials
Carter, Rick J, Sporer, Ryan, McArdle, Timothy J, Mulfinger, George Robert, Holt, Judson Robert, Beasor, Scott, Child, Amy, Fronheiser, Jody, Wahl, Jeremy A, Geisler, Holm, Kluth, George J, Triyoso, Dina H, Punchihewa, Kasun, Rana, Uzma, Vanamurthy, Laks, Sohn, D K
Published in ECS transactions (09.04.2018)
Published in ECS transactions (09.04.2018)
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Journal Article
(Invited) Factors Impacting Threshold Voltage in Advanced CMOS Integration: Gate Last (FINFET) vs. Gate First (FDSOI)
Triyoso, Dina, Carter, Rick, Kluth, Jon, Luning, Scott, Child, Amy, Wahl, Jeremy, Mulfinger, Bob, Punchihewa, Kasun, Kumar, Anil, Kang, Laegu, Sporer, Ryan, Chen, Xiaobo, Straub, Sherry, Bohra, Girish, Patil, Suraj, Zhang, Xing, Chen, Alex, Togo, Mitsuhiro, Pal, Rohit
Published in ECS transactions (08.09.2015)
Published in ECS transactions (08.09.2015)
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Journal Article
Enhancing computer ethics by increasing collaboration and peer learning
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Conference Proceeding
Modifications of growth of strained silicon and dopant activation in silicon by cryogenic ion implantation and recrystallization annealing
Itokawa, H., Berliner, N. C., Teehan, S., Wall, D. R., Wahl, J. A., Eunha Kim, Li, J., Demarest, J. J., Ronsheim, P., Paruchuri, V.
Published in 2012 12th International Workshop on Junction Technology (01.05.2012)
Published in 2012 12th International Workshop on Junction Technology (01.05.2012)
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Conference Proceeding
High sensitivity, low voltage silicon photodetectors compatible with silicon integration
Wahl, J.A., Rogers, D., Tiwari, S.
Published in Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) (2001)
Published in Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) (2001)
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Conference Proceeding