Design and simulation of SET and radiation-harden on DPLL
Weitao Yang, Chaohui He, Xuecheng Du, Yunyun Fan, Yuan Yuan
Published in 2016 IEEE Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) (01.10.2016)
Published in 2016 IEEE Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC) (01.10.2016)
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Conference Proceeding
Angular momentum dependent field emission energy distribution
Weiliang Wang, Zhibing Li, Weitao Yang
Published in 2015 28th International Vacuum Nanoelectronics Conference (IVNC) (01.07.2015)
Published in 2015 28th International Vacuum Nanoelectronics Conference (IVNC) (01.07.2015)
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Conference Proceeding
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
Azimi, Sarah, De Sio, Corrado, Yang, Weitao, Sterpone, Luca
Published in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (01.06.2020)
Published in 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) (01.06.2020)
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Conference Proceeding
Transparent ITO gate p-GaN/AlGaN/GaN UV photodetector with high responsivity and high PDCR
Han, Zhanfei, Li, Xiangdong, Wang, Hongyue, Liu, Yuebo, Wang, Meng, Yuan, Jiahui, Wang, Junbo, Yang, Weitao, You, Shuzhen, Zhang, Jincheng, Hao, Yue
Published in 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) (27.08.2023)
Published in 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) (27.08.2023)
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Conference Proceeding
Multiple transient photocurrents coupled simulation based on AD8561 MACRO-SPICE Model
Li, Yang, Wei, Jianan, He, Chaohui, Yang, Weitao, Li, Yonghong, Guo, Yaxin
Published in 2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED) (26.05.2021)
Published in 2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED) (26.05.2021)
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Conference Proceeding
Kinetic Monte Carlo Simulation of Electron-Induced Point Defects Annealing in Gallium Nitride
Huang, Chengliang, He, Chaohui, He, Huan, Hussain, Aqil, Yang, Weitao
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
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Conference Proceeding
Investigation of Single Event Effect Susceptibility of Inner Memory Blocks in 28 nm Xilinx SoC Using 239Pu
Yonghong, Li, Weitao, Yang, Chaohui, He, Yang, Li
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
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Conference Proceeding