Early Testable Addressable Logic (ETAL) Test Structure: Showcasing the use of an Alternate Logic Yield Learning Test Structure for Technology Development
Ahsan, Ishtiaq, Khan, Shahrukh, Winkler, Joerg, Sekar, Kannan, Bawaskar, Neerja, Crown, Steve, Zhang, Kan, O'tool, Martin, Lin, Teng-Yin, Lagus, Mark, Sohn, D.K., Greenslit, Daniel, Evans, Bill, Laaksonen, Toni, Gordon, Tarl, Song, Zhigang, Liu, Yandong, Masnik, John, Barth, Frank
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
A variational beam model for MEMS driven by electrostatic and piezoelectric forces
Ya-rong Zhou, Xu Yang, Teng-hao Yin, Bmg-lei Wang
Published in 2016 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) (01.10.2016)
Published in 2016 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) (01.10.2016)
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Conference Proceeding
Concurrent wireless physiological signal monitoring system for multiple freely moving rats
Hai-Yin Teng, You-De Liu, Da-Wei Chang, Chung-Ping Young, Sheng-Fu Liang, Fu-Zen Shaw
Published in 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (01.05.2013)
Published in 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (01.05.2013)
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Conference Proceeding
Defect improvement by optimizing electroplating in BEOL sub-50nm pitch
Ahmed, Shafaat, Shah, Ketan, Cheng, Tien-Jen, da Silva, Adam, Sharma, Mukta, Lin, Teng-Yin, Koli, Dinesh, Mahalingam, Anbu Selvam K M, Grunow, Stephan, Child, Craig
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
A novel fabrication process for high-aspect-ratio and co-axial multi-layer nickel microstructures
Ching-Bin Lin, Mau-Kuo Wei, Chun-Hung Liu, Chung-Hsing Yen, Zheng-Bing Su, Yin-Teng Tai, Zhi-Hong Chen
Published in Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308) (2000)
Published in Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308) (2000)
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Conference Proceeding