Oxidant Effect on Resistance Switching Characteristics of HfO2 film Grown Atomic Layer Deposition
Park, In-Sung, Lee, Jooho, Yoon, Seungki, Jung, Keum Jee, Lee, Sunwoo, Park, Jungho, Kim, Chang Kyung, Ahn, Jinho
Published in ECS transactions (28.09.2007)
Published in ECS transactions (28.09.2007)
Get full text
Journal Article
Proceedings of the 4th International Conference on Microelectronics and Plasma Technology ICMAP 2012, Jeju, Korea
LEE, Nae-Eung, HYUN WOO KIM, CHEE WON CHUNG, KIM, Chang-Il, CHAE, Heeyeop, KIM, Jiyoung, HONG, Mun Pyo, ISHIJIMA, Tatsuo, CHUNG, Chin-Wook, KIM, Hyung Jun, HYOUNG SUB KIM, JUN SIN YI, PARK, In-Sung, PU, YI-Kang
Published in Thin solid films (2013)
Get full text
Published in Thin solid films (2013)
Conference Proceeding
Brillouin scattering of simple molecular liquids at high pressure
Ahart, M., Fuming Jiang, In Sung Park, Mikami, M., Kojima, S.
Published in 1998 IEEE Ultrasonics Symposium. Proceedings (Cat. No. 98CH36102) (1998)
Published in 1998 IEEE Ultrasonics Symposium. Proceedings (Cat. No. 98CH36102) (1998)
Get full text
Conference Proceeding
Novel MIS Al/sub 2/O/sub 3/ capacitor as a prospective technology for Gbit DRAMs
In-Sung Park, Byoung Taek Lee, Sung Je Choi, Jae Soon Im, Seung Hwan Lee, Ki Yeon Park, Joo Won Lee, Yong Woo Hyung, Yeong Kwan Kim, Heung Soo Park, Young Wook Park, Sang In Lee, Moon Yong Lee
Published in 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) (2000)
Published in 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) (2000)
Get full text
Conference Proceeding