Operational amplifier based test structure for transistor threshold voltage variation
Ji, B.L., Pearson, D.J., Lauer, I., Stellari, F., Frank, D.J., Chang, L., Ketchen, M.B.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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