Duty-cycle distortion and specifications for jitter test-signal generation
Marcu, M., Durbha, S., Gupta, S.
Published in 2008 IEEE International Symposium on Electromagnetic Compatibility (01.08.2008)
Published in 2008 IEEE International Symposium on Electromagnetic Compatibility (01.08.2008)
Get full text
Conference Proceeding
Circuit optimization with X-parameter models
Biernacki, Radoslaw M., Marcu, Mihai, Root, David E.
Published in 2017 IEEE MTT-S International Microwave Symposium (IMS) (01.06.2017)
Published in 2017 IEEE MTT-S International Microwave Symposium (IMS) (01.06.2017)
Get full text
Conference Proceeding
Estimation of very low BER using Quasi-Analytical method
DingDing Lu, Gupta, S., Marcu, M.
Published in 2008 IEEE International Symposium on Electromagnetic Compatibility (01.08.2008)
Published in 2008 IEEE International Symposium on Electromagnetic Compatibility (01.08.2008)
Get full text
Conference Proceeding
Electrothermal X-Parameters for Dynamic Modeling of RF and Microwave Power Transistors
Gillespie, Sean J., Root, David E., Marcu, Mihai, Aaen, Peter H.
Published in 2018 13th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2018)
Published in 2018 13th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2018)
Get full text
Conference Proceeding
Electrothermal X-Parameters for Dynamic Modeling of RF and Microwave Power Transistors
Gillespie, Sean J., Root, David E., Marcu, Mihai, Aaen, Peter H.
Published in 2018 48th European Microwave Conference (EuMC) (01.09.2018)
Published in 2018 48th European Microwave Conference (EuMC) (01.09.2018)
Get full text
Conference Proceeding
Frequency-scalable nonlinear behavioral transistor model from single frequency X-parameters based on time-reversal transformation properties (INVITED)
Root, David E., Biernacki, Radoslaw M., Marcu, Mihai, Koh, Minghao, Tasker, Paul J.
Published in 2015 86th ARFTG Microwave Measurement Conference (01.12.2015)
Published in 2015 86th ARFTG Microwave Measurement Conference (01.12.2015)
Get full text
Conference Proceeding