High flexibility SCR clamp for ESD protection in BCD power technology
Yi-Feng Chang, Tsung-Che Tsai, Wan-Yen Lin, Chia-Wei Hsu, Jam-Wem Lee, Shui-Ming Cheng, Ming-Hsiang Song
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Conference Proceeding
A high-reliable self-isolation current-mode transmitter (CM-Tx) design for +/−60V automotive interface with Bulk-BCD technology
Wen-Yang Hsu, Po-Hsiang Lan, Wan-Yen Lin, Jam-Wem Lee, Kuo-Ji Chen, Ming-Hsiang Song
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Conference Proceeding
Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design
Cheng-Cheng Yen, Wan-Yen Lin, Ming-Dou Ker, Ching-Ling Tsai, Shih-Fan Chen, Tung-Yang Chen
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
New transient detection circuit for electrical fast transient (EFT) protection design in display panels
Ming-Dou Ker, Wan-Yen Lin, Cheng-Cheng Yen, Che-Ming Yang, Tung-Yang Chen, Shih-Fan Chen
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
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Conference Proceeding
Protection design against system-level ESD transient disturbance on display panels
Ming-Dou Ker, Wan-Yen Lin, Cheng-Cheng Yen, Che-Ming Yang, Tung-Yang Chen, Shih-Fan Chen
Published in 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility (01.04.2010)
Published in 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility (01.04.2010)
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Conference Proceeding
Novel isolation ring structure for latch-up and power efficiency improvement of smart power IC's
Jam-Wem Lee, Yi-Feng Chang, Chia-Wei Hsu, Tsung-Che Tsai, Wan-Yen Lin, Ming Hsiang Song
Published in 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2013)
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Published in 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2013)
Conference Proceeding
On-Chip ESD detection circuit for system-level ESD protection design
Ming-Dou Ker, Wan-Yen Lin, Cheng-Cheng Yen, Che-Ming Yang, Tung-Yang Chen, Shih-Fan Chen
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
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Conference Proceeding
New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels
Cheng-Cheng Yen, Wan-Yen Lin, Ming-Dou Ker, Che-Ming Yang, Shih-Fan Chen, Tung-Yang Chen
Published in 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2011)
Published in 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2011)
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Conference Proceeding