by Naik, V. B., Lim, J. H., Lee, T. Y., Neo, W. P., Dixit, H., K, S., Goh, L. C., Ling, T., Hwang, J., Zeng, D., Ting, J. W., Lee, K., Toh, E. H., Zhang, L., Low, R., Balasankaran, N., Zhang, L. Y., Gan, K. W., Hau, L. Y., Mueller, J., Pfefferling, B., Kallensee, O., Yamane, K., Tan, S. L., Seet, C. S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y., Pellerin, J., Chao, R., Kwon, J., Thiyagarajah, N., Chung, N. L., Jang, S. H., Behin-Aein, B.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Tan, J., Lim, J.H., Kwon, J.H., Naik, V.B., Raghavan, N., Pey, K.L.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Naik, V. B., Lim, J. H., Yamane, K., Kwon, J., B., Behin-Aein, Chung, N. L., K, S., Hau, L. Y., Chao, R., Chiang, C., Huang, Y., Pu, L., Otani, Y., Jang, S.H., Balasankaran, N., Neo, W. P., Ling, T., Ting, J. W., Yoon, H., Mueller, J., Pfefferling, B., Kallensee, O., Merbeth, T., Seet, C.S., Wong, J., You, Y. S., Soss, S., Chan, T. H., Siah, S. Y.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Lim, J. H., Raghavan, N., Kwon, J. H., Lee, T. Y., Chao, R., Chung, N. L., Yamane, K., Thiyagarajah, N., Naik, V. B., Pey, K. L.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Lee, T. Y., Yamane, K., Hau, L. Y., Chao, R., Chung, N. L., Naik, V. B., Sivabalan, K., Kwon, J., Lim, J. H., Neo, W. P., Khua, K., Thiyagarajah, N., Jang, S. H., Behin-Aein, B., Toh, E. H., Otani, Y., Zeng, D., Balasankaran, N., Goh, L. C., Ling, T., Hwang, J., Zhang, L., Low, R., Tan, S. L, Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Naik, V. B., Yamane, K., Lim, J. H., Lee, T. Y., Kwon, J., Aein, Behin, Chung, N. L., Hau, L. Y., Chao, R., Zeng, D., Otani, Y., Chiang, C, Huang, Y., Pu, L., Thiyagarajah, N., Jang, S. H., Neo, W. P., Dixit, H., Aris, S.K, Goh, L. C., Ling, T., Hwang, J., Ting, J. W., Zhang, L., Low, R., Balasankaran, N., Seet, C. S., Ong, S., Wong, J., You, Y. S., Woo, S. T., Siah, S. Y.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Lee, T. Y., Yamane, K., Kwon, J., Naik, V. B., Otani, Y., Zeng, D., Lim, J. H., Sivabalan, K., Chiang, C., Huang, Y., Jang, S. H., Hau, L. Y., Chao, R., Chung, N. L., Neo, W. P., Khua, K., Thiyagarajah, N., Ling, T., Goh, L. C., Hwang, J., Zhang, L., Low, R., Balasankaran, N., Tan, F., Wong, J., Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Siah, S. Y.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Lee, J.H., Kim, J.P., Lee, J.-H., Kim, Y.-S., Lim, H.-J., Jung, H.-S., Doh, S.J., Lee, N.-I., Kang, H.-K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Park, J., Lim, J.-H., Gelfand, S.B.
Published in 2003 IEEE Wireless Communications and Networking, 2003. WCNC 2003 (2003)

by Lim, J H, Sohn, S H, Yang, H S, Kim, D L, Ryoo, H S, Hwang, S D
Published in Advances in Cryogenic Engineering; Volume 53B (01.01.2008)

by Sohn, S H, Lim, J H, Yang, H S, Kim, D L, Ryoo, H S, Kim, C D, Kim, D H, Lee, S K, Hwang, S D
Published in Advances in Cryogenic Engineering; Volume 53B (01.01.2008)

by Lee, T. Y., Yamane, K., Otani, Y., Zeng, D., Kwon, J., Lim, J. H., Naik, V. B., Hau, L. Y., Chao, R., Chung, N. L., Ling, T., Jang, S. H., Goh, L. C., Hwang, J., Zhang, L., Low, R., Balasankaran, N., Tan, F., Ting, J. W., Chang, J., Seet, C. S., Ong, S., You, Y. S., Woo, S. T., Chan, T. H., Siah, S. Y.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Lim, J.-H., Gelfand, S.B.
Published in 2000 IEEE Wireless Communications and Networking Conference. Conference Record (Cat. No.00TH8540) (2000)

by Yang, H S, Kim, D L, Lee, B S, Choi, Y S, Sohn, S H, Lim, J H, Ryoo, H S, Hwang, S D
Published in Advances in Cryogenic Engineering; Volume 53B (01.01.2008)

by Oon, W. L., Lin, H. S., Pua, C. H., Lim, J. H., Lim, S. K., Rahman, F. A.
Published in 2019 IEEE 9th International Nanoelectronics Conferences (INEC) (01.07.2019)

by Kim, S B, Song, J H, Huh, H, Lim, J H
Published in WIT Transactions on Engineering Sciences (01.01.2007)

by Larrea, Anne-Sophie, Dunn, Shannon, Collison, Wenli, Franca, Daniel, Borst, Christopher, Lee, Janghee, Lim, JongHeun J H, Chang, Stock
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)

by Nam, T.W., Cho, J.M., Kim, S.I., Kim, S.H., Lim JH
Published in 2005 IEEE Engineering in Medicine and Biology 27th Annual Conference (2005)

by Lim, J.H, Rhee, H.K, Kim, Y.J, Lim, K.B, Tuyl, J.M. van
Published in Acta horticulturae (01.01.2003)

by Lim, J.H, Choi, S.T, Rhee, H.K, Cho, H.R, Joung, H.Y
Published in Acta horticulturae (01.01.2005)