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Yang, Y. F., Chen, X. P., Yao, M. H., Zhou, C. L., Liao, C. M.
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Published in International archives of the photogrammetry, remote sensing and spatial information sciences. (08.02.2020)
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RESEARCH ON CORS (CONTINUOUSLY OPERATING REFERENCE STATION) SYSTEM-BASED REGIONAL WATER VAPOR RETRIEVAL IN GUILIN
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Published in International archives of the photogrammetry, remote sensing and spatial information sciences. (08.02.2020)
Published in International archives of the photogrammetry, remote sensing and spatial information sciences. (08.02.2020)
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Correlation between Access Polarization and High Endurance (˜ 1012 cycling) of Ferroelectric and Anti-Ferroelectric HfZrO2
Hsiang, K.-Y., Liao, C.-Y., Lin, Y.-Y., Lou, Z.-F., Lin, C.-Y., Lee, J.-Y., Chang, F.-S., Li, Z.-X., Tseng, H.-C., Wang, C.-C., Ray, W.-C., Hou, T.-H., Chen, T.-C., Chang, C.-S., Lee, M. H.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Tensile behaviors of highly flowable strain hardening fiber reinforced concrete
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Lin, Y.H., Lee, C.C., Liao, C.Y., Lin, M.H., Tu, W. C., Chen, Robin, Chen, H.P., Shue, Winston S., Cao, Min
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Multiferroic Properties and Leakage Current Mechanisms of Bi0.9Eu0.1FeO3 Thin Films
KAO, M. C, CHEN, H. Z, YOUNG, S. L, CHIANG, J. L, LIN, C. C, KUNG, C. Y, LIN, C. H, LIAO, C. C
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An Automated Performance-Aware Approach to Reliability Transformations
Lidman, Jacob, McKee, Sally A., Quinlan, Daniel J., Liao, Chunhua
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Extremely Steep Switch of Negative-Capacitance Nanosheet GAA-FETs and FinFETs
Lee, M. H., Chen, K.-T., Liao, C.-Y., Gu, S.-S., Siang, G.-Y., Chou, Y.-C., Chen, H.-Y., Le, J., Hong, R.-C., Wang, Z.-Y., Chen, S.-Y., Chen, P.-G., Tang, M., Lin, Y.-D., Lee, H.-Y., Li, K.-S., Liu, C. W.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Adjustable Switching Voltage Via Sol-Gel Derived and Ag In Situ Doped SiO2 Thin Films for ReRAM
Hsiao, Yu-Ping, Yang, Wen-Luh, Lin, Yu-Hsien, Yang, Yun-Chung, Hsu, Che-Chi, Peng, Cheng-Lin, Liao, Chin-Hsuan, Chin, Fun-Tat, Liu, Sheng-Hsien, Chang, Yuan-Ming, Lin, Li-Min
Published in ECS transactions (01.01.2013)
Published in ECS transactions (01.01.2013)
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Journal Article
Bi-directional Sub-60mV/dec, Hysteresis-Free, Reducing Onset Voltage and High Speed Response of Ferroelectric-AntiFerroelectric Hf0.25Zr0.75O2 Negative Capacitance FETs
Lee, M. H., Chen, K.-T., Liao, C.-Y., Siang, G.-Y., Lo, C., Chen, H.-Y., Tseng, Y.-J., Chueh, C.-Y., Chang, C., Lin, Y.-Y., Yang, Y.-J., Hsieh, F.-C., Chang, S. T., Liao, M.-H., Li, K.-S., Liu, C. W.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
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A digital standard time distribution architecture with its applications
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Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach
Chang, H. C., Liao, P. J., Chen, S. H., Chang, Y.K., Li, C.P., Liao, W. C., Hsieh, M. H., Yang, H. W., Lee, J. H., Huang, C. M., He, Jun
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Improvement on Ferroelectricity and Endurance of Ultra-Thin HfZrO2 Capacitor with Molybdenum Capping Electrode
Chen, K.-T., Lee, M. H., Liao, C.-Y., Lo, C., Chen, H.-Y., Siang, G.-Y., Liu, S., Chang, S.-C., Liao, M.-H., Chang, S.-T.
Published in 2019 Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2019)
Published in 2019 Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2019)
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Conference Proceeding
Novel Opposite Polarity Cycling Recovery (OPCR) of HfZrO2 Antiferroelectric-RAM with an Access Scheme Toward Unlimited Endurance
Hsiang, K.-Y., Chen, Y.-C., Chang, F.-S., Lin, C.-Y., Liao, C.-Y., Lou, Z.-F., Lee, J.-Y., Ray, W.-C., Li, Z.-X., Wang, C.-C., Tseng, H.-C., Chen, P.-H., Tsai, J.-H., Liao, M. H., Hou, T.-H., Liu, C. W., Huang, P.-T., Su, P., Lee, M. H.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
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Investigation of Relaxation Behavior for Terminals of CPU Socket Connectors
Liao, K.-C., Wei-Chong Chiu
Published in 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts (01.10.2008)
Published in 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts (01.10.2008)
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Conference Proceeding
Fully utilization of TWSTT network data by weighted least squares method
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Dual-Mode GaN MOS-HEMT of Cascode Configuration with Si Ferroelectric Hf1-xZrxO2 FET
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Published in 2022 IEEE Silicon Nanoelectronics Workshop (SNW) (11.06.2022)
Published in 2022 IEEE Silicon Nanoelectronics Workshop (SNW) (11.06.2022)
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Conference Proceeding
Deep insights into Interface Effects to achieve Low-voltage Operation (<1.2V), Low Process Temperature, and First-Principle Calculation
Tang, Y.-T., Wu, T.-M., Fan, C.-L., Lai, Y.-M., Hsiang, K.-Y., Liao, C.-Y., Chang, S.-H., Yu, T.-Y., Su, P., Chang, M.-T., Huang, B.-H., Hu, C., Chang, S.-J., Chang, M.-F., Lee, M.-H.
Published in 2021 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) (25.08.2021)
Published in 2021 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) (25.08.2021)
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Conference Proceeding
Ferroelectric Al:HfO2 negative capacitance FETs
Lee, M. H., Chen, P.-G, Fan, S.-T, Chou, Y.-C, Kuo, C.-Y, Tang, C.-H, Chen, H.-H, Gu, S.-S, Hong, R.-C, Wang, Z.-Y, Chen, S.-Y, Liao, C.-Y, Chen, K.-T, Chang, S. T., Liao, M.-H, Li, K.-S, Liu, C. W.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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