A Reliability Study of a New Nanocrystalline Nickel Alloy Barrier Layer for Electrical Contacts
Do, Trent K, Lund, Alan
Published in 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (01.10.2010)
Published in 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (01.10.2010)
Get full text
Conference Proceeding
A reliability study to evaluate new compliant designs used in high speed signal applications
Do, T.K.
Published in Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004 (2004)
Published in Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004 (2004)
Get full text
Conference Proceeding