A summary of recent VLSI SEU and latch-up testing (for space application)
Kinnison, J.D., Maurer, R.H., McKerracher, P.L., Carkhuff, B.G.
Published in Workshop Record 1992 IEEE Radiation Effects Data Workshop (1992)
Published in Workshop Record 1992 IEEE Radiation Effects Data Workshop (1992)
Get full text
Conference Proceeding