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NiO removal of Ni/Au Ohmic contact to p-GaN after annealing

by 林孟喆 曹青 颜廷静 张书明 陈良惠
Published in Journal of semiconductors (01.02.2009)

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微观晶界特性对氧化锌压敏电阻宏观电气性能的影响机制

by 孟鹏飞, 郭敬科, 雷潇, 王磊, 张兵兵, 缪奎, 胡军
Published in 工程科学与技术 (01.09.2024)

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