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Search Results - 气敏电气阻
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NiO removal of Ni/Au Ohmic contact to p-GaN after annealing
by
林孟喆 曹青 颜廷静 张书明 陈良惠
Published in
Journal of semiconductors
(01.02.2009)
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微观晶界特性对氧化锌压
敏
电阻宏观
电气
性能的影响机制
by
孟鹏飞
,
郭敬科
,
雷潇
,
王磊
,
张兵兵
,
缪奎
,
胡军
Published in
工程科学与技术
(01.09.2024)
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double schottky barrier
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grain boundary partitioning
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