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Search Results - "冯立伟"
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基于增量式等距映射同双重局部密度方法的工业过程故障检测
by
冯立伟
,
孙立文
,
顾欢
,
李元
Published in
上海交通大学学报
(2024)
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基于IMDS-DLNS方法的工业过程故障检测
by
冯立伟
,
孙立文
,
顾欢
,
李元
Published in
河北科技大学学报
(2022)
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基于PC-WKNN的多工况间歇过程故障检测方法研究
by
冯立伟
,
张成
,
李元
Published in
计算机应用研究
(2018)
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基于SP-LNS-KNN的半导体生产过程故障检测方法研究
by
冯立伟
,
张成
,
谢彦红
,
李元
,
逄玉俊
Published in
计算机应用研究
(2018)
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基于时空近邻标准化和局部离群因子的复杂过程故障检测
by
冯立伟
,
李元
,
张成
,
谢彦红
Published in
控制理论与应用
(01.03.2020)
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基于密度标准误差的局部保持投影故障检测策略
by
张成
,
郭青秀
,
冯立伟
,
李元
Published in
控制理论与应用
(01.08.2020)
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局部近邻标准化偏最小二乘的多模态间歇过程故障检测
by
李元
,
马雨含
,
张成
,
冯立伟
Published in
控制理论与应用
(01.05.2020)
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基于局部保持投影-加权k近邻规则的多模态间歇过程故障检测策略
by
张成
,
郭青秀
,
冯立伟
,
李元
Published in
控制理论与应用
(01.10.2019)
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基于标准距离k近邻的多模态过程故障检测策略
by
冯立伟
,
张成
,
李元
,
谢彦红
Published in
控制理论与应用
(01.04.2019)
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基于局部保持嵌入-K近邻比率密度的半导体蚀刻过程故障诊断策略
by
张成
,
郑百顺
,
郭青秀
,
冯立伟
,
李元
Published in
控制理论与应用
(01.06.2020)
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Improvement of Metal-Graphene Ohmic Contact Resistance in Bilayer Epitaxial Graphene Devices
by
何泽召 杨克武 蔚翠 李佳 刘庆彬 芦
伟立 冯
志红 蔡树军
Published in
Chinese physics letters
(01.11.2015)
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High temperature characteristics of bilayer epitaxial graphene field-effect transistors on SiC Substrate
by
何泽召 杨克武 蔚翠 刘庆彬 王晶晶 李佳 芦
伟立 冯
志红 蔡树军
Published in
Chinese physics B
(01.06.2016)
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Jump-Dealing and Resale Price Maintenance: An Offsetting Theory and Its Policy Implications
by
于
立 冯
博 徐志
伟
Published in
China economist (Beijing, China)
(08.05.2014)
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