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Splitting Methods for Convex Clustering

by Chi, Eric C., Lange, Kenneth
Published in Journal of computational and graphical statistics (02.10.2015)

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Journal Article

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Statistical Significance of Clustering Using Soft Thresholding

by Huang, Hanwen, Liu, Yufeng, Yuan, Ming, Marron, J. S.
Published in Journal of computational and graphical statistics (02.10.2015)

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Journal Article

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Scalable Detection of Anomalous Patterns With Connectivity Constraints

by Speakman, Skyler, McFowland, Edward, Neill, Daniel B.
Published in Journal of computational and graphical statistics (02.10.2015)

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Detecting patterns in financial data through weighted time-frequency domain clustering: Detecting patterns in financial data through weighted

by Balzanella, Antonio, Fortuna, Francesca, Naccarato, Alessia
Published in Quality & quantity (01.06.2025)

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Local Pattern Detection and Clustering: Are There Substantive Differences?

by Höppner, Frank
Published in Lecture notes in computer science (2005)

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Book Chapter Conference Proceeding

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Cluster-NMS: Improving Crowded Object Detection through Clustering Pattern

by Liao, Junguo, Tian, Haonan
Published in Signal, image and video processing (01.09.2025)

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K -Profiles: A Nonlinear Clustering Method for Pattern Detection in High Dimensional Data

by Yu, Tianwei, Lu, Jianwei, Zhao, Qing, Wang, Kai
Published in BioMed research international (01.01.2015)

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Journal Article

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Modelling process durations with gamma mixtures for right-censored data: Applications in customer clustering, pattern recognition, drift detection, and rationalisation

by Yang, Lingkai, McClean, Sally, Burke, Kevin, Donnelly, Mark, Khan, Kashaf
Published in Data & knowledge engineering (01.07.2025)

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Journal Article

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A scanning method for detecting clustering pattern of both attribute and structure in social networks

by Wang, Tai-Chi, Phoa, Frederick Kin Hing
Published in Physica A (01.03.2016)

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Journal Article

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A Low Overhead High Test Compression Technique Using Pattern Clustering With n-Detection Test Support

by Wang, Seongmoon, Wei, Wenlong, Wang, Zhanglei
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2010)

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A cortex-like learning machine for temporal hierarchical pattern clustering, detection, and recognition

by Lo, James Ting-Ho
Published in Neurocomputing (Amsterdam) (15.02.2012)

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Recurrent neural network with density-based clustering for group pattern detection in energy systems

by Djenouri, Youcef, Belhadi, Asma, Lin, Jerry Chun-Wei
Published in Sustainable energy technologies and assessments (01.08.2022)

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An Incremental Clustering Algorithm with Pattern Drift Detection for IoT-Enabled Smart Grid System

by Jiang, Zigui, Lin, Rongheng, Yang, Fangchun
Published in Sensors (Basel, Switzerland) (28.09.2021)

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STAD: Ship trajectory anomaly detection in ocean with dynamic pattern clustering

by Li, Hui, Li, Wengen, Wang, Shuyu, Yang, Hanchen, Guan, Jihong, Zhang, Yichao
Published in Ocean engineering (01.12.2024)

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Journal Article

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Clustering of Pattern Recognition Receptors for Fungal Detection: e1003873

by Inoue, Makoto, Shinohara, Mari L
Published in PLoS pathogens (01.02.2014)

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Journal Article

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Detection and clustering of mixed-type defect patterns in wafer bin maps

by Kim, Jinho, Lee, Youngmin, Kim, Heeyoung
Published in IIE transactions (01.02.2018)

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From edit distance to augmented space-time-weighted edit distance: Detecting and clustering patterns of human activities in Puget Sound region

by Zhai, Wei, Bai, Xueyin, Peng, Zhong-ren, Gu, Chaolin
Published in Journal of transport geography (01.06.2019)

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Journal Article

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Clustering of Pattern Recognition Receptors for Fungal Detection

by Inoue, Makoto, Shinohara, Mari L.
Published in PLoS pathogens (01.02.2014)

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Journal Article

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Bootstrap aggregative mean shift clustering for big data anti-pattern detection analytics in 5G/6G communication networks

by Ramakrishnan, Vinothsaravanan, Chenniappan, Palanisamy, Dhanaraj, Rajesh Kumar, Hsu, Ching-Hsien, Xiao, Yingyuan, Al-Turjman, Fadi
Published in Computers & electrical engineering (01.10.2021)

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Contrastive deep clustering for detecting new defect patterns in wafer bin maps

by Baek, Insung, Kim, Seoung Bum
Published in International journal of advanced manufacturing technology (01.02.2024)

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