Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
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Corporate Author | |
---|---|
Other Authors | |
Format | Electronic eBook |
Language | English |
Published |
London :
Institution of Engineering and Technology,
2008.
|
Series | IET circuits, devices and systems series ;
19. |
Subjects | |
Online Access | Plný text |
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020 | |z 9780863417450 | ||
020 | |a 9781615833153 |q (ebook) | ||
035 | |a (OCoLC)456124034 |z (OCoLC)424642044 |z (OCoLC)623468726 |z (OCoLC)646795920 |z (OCoLC)712981930 | ||
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245 | 0 | 0 | |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits |h [elektronický zdroj] : |b the system on chip approach / |c edited by Yichuang Sun. |
260 | |a London : |b Institution of Engineering and Technology, |c 2008. | ||
300 | |a 1 online zdroj (xx, 389 pages) : |b illustrations. | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a počítač |b c |2 rdamedia | ||
338 | |a online zdroj |b cr |2 rdacarrier | ||
490 | 1 | |a Circuits, devices and systems series ; |v 19 | |
500 | |a Title from title screen. | ||
504 | |a Includes bibliographical references and index. | ||
590 | |a Knovel Library |b ACADEMIC - Electronics & Semiconductors | ||
506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity | ||
650 | 0 | |a Linear integrated circuits |x Testing. | |
650 | 0 | |a Mixed signal circuits |x Testing. | |
650 | 0 | |a Radio frequency integrated circuits |x Testing. | |
655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
655 | 9 | |a electronic books |2 eczenas | |
700 | 1 | |a Sun, Yichuang. |4 edt | |
710 | 2 | |a Institution of Engineering and Technology. | |
776 | 0 | 8 | |i Print version: |t Test and diagnosis of analogue, mixed-signal and RF integrated circuits. |d London : Institution of Engineering and Technology, 2008 |z 9780863417450 |w (OCoLC)180473599 |
830 | 0 | |a IET circuits, devices and systems series ; |v 19. | |
856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpTDAMSRF1/test_and_diagnosis_of_analogue_mixedsignal_and_rf_integrated_circuits__the_system_on_chip_approach |y Plný text |
992 | |a BK |c KNOVEL | ||
999 | |c 78924 |d 78924 |