Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

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Bibliographic Details
Corporate Author Institution of Engineering and Technology
Other Authors Sun, Yichuang (Editor)
Format Electronic eBook
LanguageEnglish
Published London : Institution of Engineering and Technology, 2008.
SeriesIET circuits, devices and systems series ; 19.
Subjects
Online AccessPlný text

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245 0 0 |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits  |h [elektronický zdroj] :  |b the system on chip approach /  |c edited by Yichuang Sun. 
260 |a London :  |b Institution of Engineering and Technology,  |c 2008. 
300 |a 1 online zdroj (xx, 389 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
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490 1 |a Circuits, devices and systems series ;  |v 19 
500 |a Title from title screen. 
504 |a Includes bibliographical references and index. 
590 |a Knovel Library  |b ACADEMIC - Electronics & Semiconductors 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Linear integrated circuits  |x Testing. 
650 0 |a Mixed signal circuits  |x Testing. 
650 0 |a Radio frequency integrated circuits  |x Testing. 
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655 9 |a electronic books  |2 eczenas 
700 1 |a Sun, Yichuang.  |4 edt 
710 2 |a Institution of Engineering and Technology. 
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