Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications

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Bibliographic Details
Main Author Rein, Stefan (Author)
Format Book
LanguageEnglish
Published Berlin ; Heidelberg ; New York : Springer, [2005]
SeriesSpringer series in materials science
Subjects
spektroskopie
polovodiče
fotovoltaika
silikony
elektronová spektroskopie
technická diagnostika
spectroscopic analysis
semiconductors
photovoltaics
silicones
electron spectroscopy
technical diagnostics
monografie
monographs

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