Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications
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Main Author | |
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Format | Book |
Language | English |
Published |
Berlin ; Heidelberg ; New York :
Springer,
[2005]
|
Series | Springer series in materials science
|
Subjects |
Cover
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Physical Description: | xxvi, 489 stran : ilustrace ; 25 cm |
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Bibliography: | Obsahuje bibliografie a rejstřík |
ISBN: | 3540253033 978-3-540-25303-7 |
ISSN: | 0933-033X ; |