Introduction to quantum metrology : the revised SI system and quantum standards
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Main Author | |
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Format | Book |
Language | English |
Published |
Cham :
Springer,
2019
|
Edition | Second edition |
Subjects |
Cover
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Physical Description: | xiv, 326 stran : ilustrace ; 24 cm |
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Bibliography: | Obsahuje bibliografii a rejstřík |
ISBN: | 978-3-030-19679-0 |