Introduction to quantum metrology : the revised SI system and quantum standards

Saved in:
Bibliographic Details
Main Author Nawrocki, Waldemar (Author)
Format Book
LanguageEnglish
Published Cham : Springer, 2019
EditionSecond edition
Subjects

Cover

Loading…
More Information
Physical Description:xiv, 326 stran : ilustrace ; 24 cm
Bibliography:Obsahuje bibliografii a rejstřík
ISBN:978-3-030-19679-0