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Okumu, John
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Lab VIEW run four point probe device : electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW
by
Agumba, John
,
Karimi, Patrick
,
Okumu, John
Year of Publication
2012
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Related Subjects
automated measuring systems
automatizované měřicí systémy
electric conductivity
electric properties of materials
elektrická vodivost
elektrické vlastnosti materiálů
fyzika tenkých vrstev
material testing
physics of thin layers
polovodiče
semiconductors
tenké vrstvy
thin films
zkoušení materiálů